A group of students and faculty from Missouri University of Science and Technology were honored at the 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) this spring. The event is the largest of its kind.

Award recipients include:

Jingdong Sun, a graduate student in electrical engineering from Rolla, Missouri, Srinath Penugonda, a graduate student in electrical engineering from Vijayawada, India, and Xiang Fang, a graduate student in electrical engineering from Rolla, Missouri, won the 2015 IEEE EMC Student Hardware Design contest. The team successfully built high-speed clock circuitry to achieve a balanced differential signal over certain printed circuit board traces.

Dr. Jun Fan, associate professor of electrical and computer engineering, received the IEEE Electromagnetic Compatibility Society Certificate of Appreciation for his service to the IEEE EMC Society by serving as the Technical Program Chair for the Symposium.
Three papers authored by Missouri S&T faculty, alumni, students and visiting scholars earned Best Paper Awards during the symposium. Winning papers were:

“On-chip linear voltage regulator module (VRM) effect on power distribution network (PDN) noise and jitter at high-speed output buffer” won the Symposium Best Paper Award. The paper was co-authored by Heegon Kim, a visiting scholar from Korea Advanced Institute of Science and Technology; Sukjin Kim, a visiting Ph.D. student from Korea Advanced Institute of Science and Technology;  Jingook Kim, an assistant professor from Ulsan National Institute of Science and Technology in Korea; Joungho Kim, a professor from Korea Advanced Institute of Science and Technology; Changwook Yoon, a former post-doctoral fellow at Missouri S&T and engineer at Altera Corp.; Brice Achkir, a distinguished engineer at Cisco. The paper was overseen by Fan.

“Radiation physics from two-wire transmission lines” won the Symposium Best Student Paper Award. The paper was co-authored by Jing Li, a graduate student in electrical engineering from Beijing; Yaojiang Zhang, a former associate research professor at Missouri S&T; Dazhao Liu, a graduate in electrical engineering from San Jose, California; Alpesh Bhobe, an engineer at Cisco, and James Drewniak, Curators’ Professor of electrical and computer engineering at Missouri S&T . The paper was overseen by Fan.

“Near-field coupling estimation by source reconstruction and Huygen’s equivalence principle,” was also awarded the Symposium Best Student Paper. The paper was co-authored by Liang Li, a graduate student in electrical engineering from Rolla; Jingnan Pan, a graduate student in electrical engineering from Luoyang, China; Chulsoon Hwang, an engineer at Samsung Electronics; Gyuyeong Cho, an engineer at Samsung Electronics; HarkByeong Hark, an engineer at Samsung Electronics, and Yaojing Zhang. The paper was overseen by Fan.